HX5N0 series automatic probe table is a professional integrated and efficient automatic automatic wafer probe table，Have space savings，High efficiency and other features，Suitable for 4 - and 5-inch wafers，Inclusion diode，triode，Measurement of MOSFET tubes, optoelectronic devices, sensors and vertically structured chips，Optional multi-pin test function，It can realize the requirements of multiple measurement at the same time，Increase the testing capacity of the machine。

Product features:

  It is suitable for wafer high-speed automatic test, supports multi-channel test function, has a variety of flexible test methods and rich data processing functions。 It can realize automatic scanning, alignment and positioning functions。Products can also be customized and developed according to different needs of various additional functions。The structure adopts a fully automatic and semi-automatic combination, the fully automatic probe table can also be used alone, with automatic loading and unloading function, at the same time, the crystal boat behind the buffer zone, support the test workshop automation, automatic loading of the crystal boat, can realize the test workshop unmanned。

Software function introduction
1.Can test wafer, test range is optional, support interlace sampling and ring test, MAP map can be edited test;
2.Support bad point retest;
3.With offline and synchronous functions;
4.With contact buffer function, needle mark stability;
5.Operation accuracy compensation function to ensure the stability of the test;
6.Test yield, total, speed display;
7.CCD image automatic alignment and positioning;
8.The equipment has certain anti-interference ability, supports high and low temperature test, and runs stably.
9.Multi-bin classification test, test data can be stored, can be exported, compatible with the format of back-end devices, with data statistical analysis function;
10.Operator, administrator, system manufacturer rights management function;