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Electromagnet low temperature probe PSM-EM series

Electromagnet low temperature probe PSM-EM series

The PSM-EM Cryogenic probe is a closed cycle horizontal field electromagnet probe with the addition of +0.The 6T horizontal electromagnets enhance the performance of standard probe stations and can provide a 4 for testing electrical parameters of semiconductor chips.5K-350K high and low temperature vacuum test environment,It can do all the standard I's,CV,Microwave and photoelectric experiments and horizontal electromagnetic field measurements,Researchers can use it to perform magnetic transport measurements,PSM-EM is a high quality probe for vector magnetic transport measurement in low temperature probe stations, which can achieve large magnetic fields of samples,It also enables non-destructive electrical testing of chips, wafers and devices in a low temperature vacuum environment。Detailed parameters and indicators please consult online customer service!

Electromagnet low temperature probe table PSM-EM series product overview

  Low temperature probe station plays a vital role in scientific research and technology development。It can perform a variety of non-destructive physical and electrical properties tests on samples at low temperatures, helping researchers to deeply understand the various physical and electrical properties of materials or devices, so as to provide important data support for the development and application of new materials。

  The PSM-EM Cryogenic probe is a closed cycle horizontal field electromagnet probe with the addition of +0.The 6T horizontal electromagnets enhance the performance of standard probe stations and can provide a 4 for testing electrical parameters of semiconductor chips.5K-350K high and low temperature vacuum test environment,It can do all the standard I's,CV,Microwave and photoelectric experiments and horizontal electromagnetic field measurements,Researchers can use it to perform magnetic transport measurements,PSM-EM is a high quality probe for vector magnetic transport measurement in low temperature probe stations, which can achieve large magnetic fields of samples,It also enables non-destructive electrical testing of chips, wafers and devices in a low temperature vacuum environment。


Electromagnet low temperature probe PSM-EM series technical parameters