Liquid nitrogen high and low temperature probe station plays a vital role in scientific research and technology development。It can perform a variety of non-destructive physical and electrical properties tests on samples at low temperatures, helping researchers to deeply understand the various physical and electrical properties of materials or devices, so as to provide important data support for the development and application of new materials。

  PSM-LN2 series liquid nitrogen high and low temperature probe can provide an 80K-800K high and low temperature vacuum test environment for the electrical parameter test of semiconductor chips，Through the external connection of different electrical measuring instruments，Can complete the integrated circuit voltage, current, resistance and IV curve and other parameters detection，For non-destructive electrical testing of chips, wafers and devices in low temperature vacuum environments。

特点
• Liquid nitrogen high and low temperature vacuum probe table, cavity vacuum can reach 10E-4torr within 15 minutes, liquid nitrogen consumption is small, drop to temperature only 0.2L liquid nitrogen, easy to use and economical。
• The displacement adjustment of the probe arm is operated outside the vacuum chamber, allowing different components on the sample to be switched for testing without destroying the vacuum。
• Unique probe arm X-Y-Z-R four-dimensional adjustment for 4-inch sample testing。
• The vacuum chamber is made of aluminum, which can effectively reduce external electromagnetic interference and improve the accuracy and stability of the test
• The probe arm adopts a triaxial connector with good leakage performance and measured leakage current less than 100fA@1V@80K--800K
• Wide test temperature range, support 80K-800K continuous temperature change。
• Uniquely designed flexible probe, which is mounted on copper shrapnel to avoid sample or electrode damage due to excessive force during needle insertion
• The top cover adopts clamshell structure, which makes changing sample more convenient。

Test data

Parameters and indicators: